Silicon Labs /Series0 /EFM32GG /EFM32GG295F512 /LESENSE /CH7_INTERACT

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Interpret as CH7_INTERACT

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0ACMPTHRES0 (SAMPLE)SAMPLE 0 (NONE)SETIF 0 (DISABLE)EXMODE 0 (EXCLK)EXCLK 0 (SAMPLECLK)SAMPLECLK 0 (ALTEX)ALTEX

SETIF=NONE, EXMODE=DISABLE

Description

Scan configuration

Fields

ACMPTHRES

Set ACMP threshold

SAMPLE

Select sample mode

SETIF

Enable interrupt generation

0 (NONE): No interrupt is generated

1 (LEVEL): Set interrupt flag if the sensor triggers.

2 (POSEDGE): Set interrupt flag on positive edge on the sensor state

3 (NEGEDGE): Set interrupt flag on negative edge on the sensor state

EXMODE

Set GPIO mode

0 (DISABLE): Disabled

1 (HIGH): Push Pull, GPIO is driven high

2 (LOW): Push Pull, GPIO is driven low

3 (DACOUT): DAC output

EXCLK

Select clock used for excitation timing

SAMPLECLK

Select clock used for timing of sample delay

ALTEX

Use alternative excite pin

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